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  • Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Εικόνα της Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
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ΚΩΔΙΚΟΣ ΠΡΟΪΟΝΤΟΣ: CYS EN IEC 63287-2:2023
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This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.