0 Καλάθι
Εγγραφή Σύνδεση
0 Καλάθι
Εγγραφή Σύνδεση
  • Αρχική σελίδα /
  • Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Εικόνα της Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Γίνε ο πρώτος που θα αξιολόγησει αυτό το προϊόν
ΚΩΔΙΚΟΣ ΠΡΟΪΟΝΤΟΣ: CYS EN 60749-5:2017
€30.00
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.