0 Καλάθι
Εγγραφή Σύνδεση
0 Καλάθι
Εγγραφή Σύνδεση
  • Αρχική σελίδα /
  • Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
Εικόνα της Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.
Γίνε ο πρώτος που θα αξιολόγησει αυτό το προϊόν
ΚΩΔΙΚΟΣ ΠΡΟΪΟΝΤΟΣ: CYS EN IEC 63364-1:2023
€37.00
This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.